Remove a small header that is used only by one file. NFC.
git-svn-id: https://llvm.org/svn/llvm-project/lld/trunk@353331 91177308-0d34-0410-b5e6-96231b3b80d8
diff --git a/ELF/Bits.h b/ELF/Bits.h
deleted file mode 100644
index 7686a9e..0000000
--- a/ELF/Bits.h
+++ /dev/null
@@ -1,34 +0,0 @@
-//===- Bits.h ---------------------------------------------------*- C++ -*-===//
-//
-// Part of the LLVM Project, under the Apache License v2.0 with LLVM Exceptions.
-// See https://llvm.org/LICENSE.txt for license information.
-// SPDX-License-Identifier: Apache-2.0 WITH LLVM-exception
-//
-//===----------------------------------------------------------------------===//
-
-#ifndef LLD_ELF_BITS_H
-#define LLD_ELF_BITS_H
-
-#include "Config.h"
-#include "llvm/Support/Endian.h"
-
-namespace lld {
-namespace elf {
-
-inline uint64_t readUint(uint8_t *Buf) {
- if (Config->Is64)
- return llvm::support::endian::read64(Buf, Config->Endianness);
- return llvm::support::endian::read32(Buf, Config->Endianness);
-}
-
-inline void writeUint(uint8_t *Buf, uint64_t Val) {
- if (Config->Is64)
- llvm::support::endian::write64(Buf, Val, Config->Endianness);
- else
- llvm::support::endian::write32(Buf, Val, Config->Endianness);
-}
-
-} // namespace elf
-} // namespace lld
-
-#endif
diff --git a/ELF/SyntheticSections.cpp b/ELF/SyntheticSections.cpp
index f1b5c77..bd7bbe2 100644
--- a/ELF/SyntheticSections.cpp
+++ b/ELF/SyntheticSections.cpp
@@ -14,7 +14,6 @@
//===----------------------------------------------------------------------===//
#include "SyntheticSections.h"
-#include "Bits.h"
#include "Config.h"
#include "InputFiles.h"
#include "LinkerScript.h"
@@ -58,6 +57,17 @@
constexpr size_t MergeNoTailSection::NumShards;
+static uint64_t readUint(uint8_t *Buf) {
+ return Config->Is64 ? read64(Buf) : read32(Buf);
+}
+
+static void writeUint(uint8_t *Buf, uint64_t Val) {
+ if (Config->Is64)
+ write64(Buf, Val);
+ else
+ write32(Buf, Val);
+}
+
// Returns an LLD version string.
static ArrayRef<uint8_t> getVersion() {
// Check LLD_VERSION first for ease of testing.
